IP test probe kit

IP1X/2X/3X/4X Test Probes China Manufacturer

IP Test Probe Kit is a set of tools used to determine the degrees of protection provided by product enclosure against access to hazardous parts and ingress of solid foreign objects. It consists of access probes and object probes, which are required to be pushed against or inserted through any openings of the enclosure with the specified forces during testing. The access probes are used to simulate in a conventional manner a part of a person or a tool held by an operator to confirm whether there is sufficient clearance from hazardous parts. The object probes are applied to simulate solid foreign objects to confirm the possibility of ingress into an enclosure.

AmadeTech IP test probes are made of insulating nylon material and stainless steel. Each of the test probes is equipped with a wire and an alligator clip to connect to the hazardous parts inside the enclosure conveniently when testing on low-voltage equipment. This signal-circuit method requires an additional low-voltage supply and a suitable lamp, which are available from AmadeTech If needed. During the test, you can accurately determine whether the test probe and hazardous parts are in contact by observing whether the light is on. Alternatively, Measuring the resistance between the test probe and the live parts with a multimeter to check for a loop can achieve the same purpose during the test.

Power supply for IP test probe

Power supply

Except IP2X requires the use of a Jointed test finger to carry out the test for protection against access to hazardous parts and the sphere of 12.5 mm in diameter to conduct the test for protection against solid foreign objects, for other IP1X, IP3X, and IP4X, the one test level for assessing the protection against hazardous parts and solid foreign objects can share one test probe. IP4X test probe can also be used for IP5X and IP6X protection tests against hazardous parts.

If you require more IP testing equipment for dust and water resistance tests, please click HERE to learn more.

Item

Schematic Diagram

Parameters

Applications

Physical Picture

IP1X test probe - 50.0 mm diameter sphere

Schematic diagram of IP1X test sphere
  • Sphere diameter: 50 mm

  • Guard diameter: 45 mm & guard thickness: 4 mm

  • Handle length: 100 mm & handle diameter: 10 mm

  • Required test force: 50 N ± 10 %

Test for protection against access to hazardous parts & solid foreign objects required by IP3X or IPXXA

IP1X Test sphere

IP2X access probe - Jointed test finger

Schematic diagram of IP2X Jointed test finger

  • Finger length: 80 mm and utmost diameter: 12 mm

  • The finger consists of 2 joints able to be bent over an angle of up to  90°

  • Stop face: 50 mm in diameter x 20 mm

  • Required test force: 10 N ± 10 %

Test for protection against access to hazardous parts required by IP2X or IPXXB

IP2X Jointed test finger

IP2X object probe - 12.5 mm diameter sphere

schematic diagram of IP2X object probe

  • Sphere diameter: 12.5 mm

  • Guard diameter: 10 mm & guard thickness: 4 mm

  • Handle length: 100 mm & handle diameter: 4 mm

  • Required test force: 30 N ± 10 %

Test for protection against Solid foreign objects required by IP2X

IP2X Object probe

IP3X test probe - Test rod

Schematic diagram of IP3X Test rod
  • Rigid test rod length: 100 mm & rod diameter: 2.5 mm

  • Rigid test rod length: 100 mm & rod diameter: 2.5 mm

  • Handle length: 100 mm & handle diameter: 10 mm

  • Required test force: 3 N ± 10 %

Test for protection against access to hazardous parts & solid foreign objects required by IP3X or IPXXC

IP3X Test rod

IP4X test probe - Test wire

Schematic diagram of IP4X test wire
  • Rigid test wire length: 100 mm & wire diameter: 1.0 mm

  • Stop face: 35 mm diameter sphere

  • Handle length: 100 mm & handle diameter: 10 mm

  • Required test force: 1 N ± 10 %

Test for protection against access to hazardous parts required by IP4X, IP5X, and IP6X or IPXXD

IP4X test wire

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Difference Between the AmadeTech IP Test Probes with and Without the Thrust Indicator

In terms of the means to measure the test force applied to the enclosure, AmadeTech can provide test probes with or without the thrust self-measuring systems. The system consists of a 2-in-1 sleeve-type handle and a spring device built into the handle, allowing the probe’s front-end metal part to extend and shorten back and forth as the force applied against the enclosure changes. The graduations of desired force values are marked on the surface of the thinner handle at the front, such as 30 N, 10 N, 3 N, etc. The force values corresponding to the graduation positions are obtained through calibration using a professional measuring instrument.

Taking into account the influence of the test probe’s own weight on the force application in different test directions during testing, for the IP3X and IP4X probes whose test force is not large and easy to be interfered with, we calibrate and mark the same force in three directions: up, down, and horizontally. Three different graduations on the handle facilitate you to perform the test from different directions and enhance the accuracy of the applied force during the test.

If you don’t want the test probes with the thrust indicator, test probes without the thrust self-measuring system are also available from AmadeTech. In order to ensure that the force applied meets the requirements of relevant standards during testing, you must prepare an additional push gauge (refer to the right figure). During the test, you need to hold the test head vertically against the tail of the IP test probe (or connect both securely with the M6 screw) and slowly push forward to apply force while observing the force value display window until it reaches the specified value.

self measuring graduations
IP test probes with thrust indicator

Probes without thrust indicators

Digital push & pull gauge

Digital push gauge

FAQs

When testing the protection of persons against hazardous parts on low-voltage equipment, a low-voltage supply in series with a suitable lamp needs to be connected between the probe and the hazardous parts inside the enclosure. After the setup, you are required to push the access probe against or (IP2X) inserted through any openings of the enclosure with the specified force listed in the standard you follow.

When testing the protection against the ingress of solid foreign objects, you need to push the object probe against any openings of the enclosure with the given force.

For testing the protection of persons against hazardous parts, the protection level is eligible if adequate clearance is kept between the access probe and hazardous parts. The lamp shall not light if verified by a signal circuit between the probe and hazardous parts. When using the IP1X access sphere, it should not completely pass through the opening.

For testing the protection against the ingress of solid foreign objects, the protection level is eligible if the full diameter of the probe doesn’t pass through any opening.

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Contact Form Demo (#3)